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Veeco Dimension 3100 Scanning Probe Microscope

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The microscope comes with a suite of versatile scanners and controllers and provides analysis for a range of advanced SPM scanning modes which include:

  • Atomic force microscopy, in tapping and contact mode
  • Conducting atomic force microscopy
  • Fluid imaging cell using atomic force microscopy
  • Scanning tunneling microscopy
  • Nanoindentation software and manipulation

The microscope is adapted with a suite of data manipulation software and allows phase, friction and amplitude imaging.

Veeco Dimension 3100 Scanning Probe Microscope